Focused Ion Beam Systems
Focused Ion Beam Systems
Focused Ion Beam Systems

Range of application

As with the JEOL high-resolution scanning electron microscopes, the FIB systems also never compromise between maximum resolution and analytics. From defect analysis in the semiconductor industry to lamella preparation for transmission electron microscopy and the 3D reconstruction of biological samples under cryogenic conditions – the robust FIB systems from JEOL will support you with all preparatory and analytical matters.

Solutions

  • Ultra-fast analytics and reconstruction by high electron and ion beams
  • Precise, reliable 3D analytics with EDS and EBSD without sample rotation
  • Convenient transfer solutions to JEOL electron microscopes
  • Integrated solutions for correlative microscopy

Products

Detailed solutions

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