Second-hand Equipment

Second-hand Equipment

A selection of JEOL second-hand equipment is listed below.
Please contact us if you have questions about specific instruments or prices.

JSM-IT300HR InTouchScope™

Scanning electron microscope

Features

High resolution scanning electron microscope with JEOL patented “High Brightness” field emission electron gun (FEG)

  1. New high-brightness field emission electron gun and optical system, providing high resolution imaging and high spatial resolution analysis.
  2. Fully integrated and automated low vacuum system.
  3. Streamlined and intuitive operation is enabled by touch panel functionality. Improved automation and recipe functions allow fastest results and maximum through-put, in multi-user laboratories.
  4. Easy-to-use graphical software interface includes full integration of image observation and element analysis, allowing even novice users to perform any task with high efficiency.
  5. Large specimen stage to accommodate various sample sizes. Fastest chamber pumping times and an additional air-lock system* result in a perfect transfer solution even for the most sensitive of samples.
  6. Small footprint and modest room installation requirements similar to conventional general-purpose SEMs.

* Optional

JEM-1400Plus

Transmission Electron Microscope JEOL JEM-1400Plus from our applications laboratory.

Features

  • User-friendly interface with many automated functions
  • Intuitive user guide for new users via touchscreen or mouse
  • Function oriented expert mode
  • Multiple user login
  • Remote control through network
  • Completely rotation-corrected lens system
  • Minimum dose system

IB-19510CP

Easy-to-operate preparation system for the production of specimen cross-sections for SEM, EPMA and auger applications.
JEOL Cross section polisher IB-19510CP from our applications laboratory

Features

Improvements to facilitate fast and easy processing of a wide range of materials include:

  • High-speed processing achieved with a new ion source
  • Reduced specimen damage with fine milling & intermittent mode
  • A Quick Start function reduces total process time
  • A monitor camera is standard, allowing real-time monitoring of the milling process
  • Charge preventive IN-situ coating function (option)

JEM-1010

The JEM-1010 is a cost-effective and powerful high-resolution electron microscope with an acceleration voltage up to 100 kV.

Features

  • User-friendly interface with many automated functions
  • Completely rotation-corrected lens system
  • Adjustable image rotation for specimen orientation
  • Minimum dose system
  • As a standard with dual specimen holder
  • Tiltable specimen goniometer
  • High performance vacuum system permits the use of an LaB6 cathode without additional modifications

Contact Form

We are happy to answer your questions at no charge and free of obligation and can offer consulting on upcoming projects.
Please use the following contact form (* = mandatory field) for your personal data.

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