The JSM-IT300HR is the latest addition the high appreciated and award-winning JEOL InTouchScope SEM family. By implementing a new high-brightness field emission electron gun as well as a fully integrated JEOL EDS system the JSM-IT300HR clearly outperforms the competition in imaging and analytical capabilities.
Designed and crafted with a multi-user environments in mind, the new JSM-IT300HR combines highest performance with an outstanding ease of use.
High resolution scanning electron microscope with JEOL patented “High Brightness” field emission electron gun (FEG)
* Optional
JEOL fully integrated EDS Detector
Accelarating voltage | 0,5 kV - 30 kV |
Resolution (HV) | 1,5 nm (30kV), 4,0 nm (1kV) |
Resolution (LV) | 1,8 nm (15kV, BED) |
Low vacuum | Bis 150Pa |
Magnification | 5x to 600.000x |
Large analytical chamber | 340mm Durchmesser |
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.